Atomic Force Microscopy-Based Electrical Characterization of Materials.cAlba Avila
This timely book introduces the fundamental measurement concepts of the rapidly evolving atomic force microscopy (AFM) techniques for electrical characterization (EFM). It describes experimental approaches and setups, as well as challenges to overcome, and it also provides a wide range of real-world examples illustrating the method. This comprehensive guide for EFM techniques and their applications is an excellent reference for those working on microscopy in different fields, making the methods more accessible to a wider audience and enabling readers to explore the numerous possibilities of electrical techniques as research tools.
Read online Atomic Force Microscopy-Based Electrical Characterization of Materials Buy and read online Atomic Force Microscopy-Based Electrical Characterization of Materials Download and read Atomic Force Microscopy-Based Electrical Characterization of Materials for pc, mac, kindle, readers Download to iPad/iPhone/iOS, B&N nook Atomic Force Microscopy-Based Electrical Characterization of Materials
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Author: Alba Avila
Number of Pages: 288 pages
Published Date: 15 Mar 2018
Publisher: Taylor & Francis Inc
Publication Country: Bosa Roca, United States
Language: English
ISBN: 9781439882993
File size: 20 Mb
File Name: Atomic.Force.Microscopy-Based.Electrical.Characterization.of.Materials.pdf
Download Link: Atomic Force Microscopy-Based Electrical Characterization of Materials
---------------------------------------------------------------
Author: Alba Avila
Number of Pages: 288 pages
Published Date: 15 Mar 2018
Publisher: Taylor & Francis Inc
Publication Country: Bosa Roca, United States
Language: English
ISBN: 9781439882993
File size: 20 Mb
File Name: Atomic.Force.Microscopy-Based.Electrical.Characterization.of.Materials.pdf
Download Link: Atomic Force Microscopy-Based Electrical Characterization of Materials
---------------------------------------------------------------
This timely book introduces the fundamental measurement concepts of the rapidly evolving atomic force microscopy (AFM) techniques for electrical characterization (EFM). It describes experimental approaches and setups, as well as challenges to overcome, and it also provides a wide range of real-world examples illustrating the method. This comprehensive guide for EFM techniques and their applications is an excellent reference for those working on microscopy in different fields, making the methods more accessible to a wider audience and enabling readers to explore the numerous possibilities of electrical techniques as research tools.
Read online Atomic Force Microscopy-Based Electrical Characterization of Materials Buy and read online Atomic Force Microscopy-Based Electrical Characterization of Materials Download and read Atomic Force Microscopy-Based Electrical Characterization of Materials for pc, mac, kindle, readers Download to iPad/iPhone/iOS, B&N nook Atomic Force Microscopy-Based Electrical Characterization of Materials